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                                       Details for article 3041 of 6539 found articles
 
 
  Low-temperature photoluminescence characterization of defects formation in hydrogen and helium implanted silicon at post-implantation annealing
 
 
Title: Low-temperature photoluminescence characterization of defects formation in hydrogen and helium implanted silicon at post-implantation annealing
Author: Mudryi, A.V.
Korshunov, F.P.
Patuk, A.I.
Shakin, I.A.
Larionova, T.P.
Ulyashin, A.G.
Job, R.
Fahrner, W.R.
Emtsev, V.V.
Davydov, V.Yu.
Oganesyan, G.
Appeared in: Physica. B, Condensed matter
Paging: Volume 308-310 (2001) nr. C pages 4 p.
Year: 2001
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3041 of 6539 found articles
 
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